On May 2, 2011 local time in California, USA, Bruker released an innovative and unique appearance of a new atomic force microscope-DimensionFastScanTM, which improves the imaging speed of the microscope without sacrificing nanometer resolution A major breakthrough has been made. DimensionFastScanTM is hundreds of times faster than other AFM scanning speeds. It can produce results in seconds or minutes instead of hours or days. It is the world's fastest scanning high-resolution atomic force microscope.
In view of the increasing demand for observing and understanding materials on the nanoscale, as the newest member of the world's most widely used atomic force microscopy platform, DimensionFastScan uses several innovative technologies to enable fast scanning speed, high resolution and accuracy of images Achieve a perfect balance. Based on the successfully designed atomic force microscope architecture, DimensionFastScan is a tip-scanning system that can provide measurement of large and small samples in air or liquid.
"DimensionFastScan achieves one of Bruker ’s goals in atomic force microscopy technology. This instrument will enable our users to work more efficiently without losing the resolution and accuracy of the image. High quality is achieved in such a short time "This is a breakthrough," said Dr. Mark R. Munch, President of the Nano Surface Division of Brooke. "With 38 patented technologies, DimensionFastScan has a higher scanning speed than previous research-level atomic force microscopes. This is its Special feature."
"By providing more effective access to nano-scale information, DimensionFastScan expresses Bruker's commitment to the scientific community." Bruker's Atomic Force Microscope Business Vice President and General Manager David V. Rossi added, "Our new DimensionFastScan, which and ScanAsyst, PeakForceQNM The combination of other Bruker's Atomic Force Microscope products can significantly improve work efficiency and also provide new quantitative information at the nanometer level. This will make Bruker's Atomic Force Microscope series products easier to use in academia and industry. "
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