Renishaw announces the latest joint results at MRS Fall

At the MRS Fall conference in Boston, Renishaw officially introduced the latest Raman spectrometer and atomic force microscope combined system successfully developed by the company and Bruker Nano, which was praised by the participants. The announcement of this news once again proves Renishaw's corporate purpose of technological innovation.

This Raman-AFM combined system is composed of Renishaw's most automated InVia-Reflex laser Raman spectrometer and Bruker's compact Innova-type atomic force microscope. The two are connected through a dedicated optomechanical interface, so that the microscope objective is accurately focused on the position of the AFM needle tip, and the laser light source and Raman scattered light are efficiently transmitted between the inVia Raman spectrometer and the Innova atomic force microscope, thereby ensuring high-quality data Was quickly collected.

The Raman system and the atomic force system can share the location information of the measured point through a dedicated connection interface, and the operator can easily acquire AFM images and Raman images simultaneously in the same area of ​​the same sample. In addition, the two systems still have their own standard software packages and control computers, which can be used independently if necessary.

During the meeting, Renishaw displayed this latest combination system to everyone at the booth, which attracted many participants to visit. A group of application experts from Bruker also answered technical questions about the AFM system and demonstrated to the visitors the ability of the Innova type AFM system to work independently.

The Raman-AFM combination system's compact appearance, application flexibility, and needle tip enhanced Raman scattering (TERS) testing capabilities have attracted wide attention from visitors. The advantages of its simple analysis setting and convenient sample replacement also brought them unexpected surprises.

This original combination system has completely changed the Raman-AFM combination, making it more effective and easier to use. Renishaw's Raman-AFM combined technical team looks forward to users using the inVia-Innova combined system to obtain more and better research results.

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